1.

The main aim of using SIFT for feature extraction is to obtain features that are very sensitive to changes in scale, rotation, image resolution, illum

Answer»

The main AIM of using SIFT for feature extraction is to obtain features that are very sensitive to changes in scale, ROTATION, image resolution, illumination, etc.
Choose the correct answer from below options
(1)TRUE
(2)FALSE

Answer:-(2)FALSE



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