This interference film is used to measure the thickness of slides, paper, etc. The arrangement is as shown in fig. For the sake of clarity, the two strips are shown thick. Consider the wedge formed in between strips 1 and 2. If the interference pattern because of the two waves reflected from wedge surface is observed, then from the observed data we can compute thickness of paper, refractive index of the medium filled in wedge, number of bonds formed, etc. Considre the strips to be thick as compared to wavelength of ligth and light is incident normally. Neglect the effect due to reflection from top surface of strip 1 and bottom surface of strip 2. Take `L = 5 cm` and `lambda_(air) = 40 nm`. For data in question53 determine the distance of point B from the 20th dark band. Counting of dark point has to start from the contact point.A. 4 cmB. 3 cmC. 5 cmD. 2cm

This interference film is used to measure the thickness of slides, pap

1.	This interference film is used to measure the thickness of slides, paper, etc. The arrangement is as shown in fig. For the sake of clarity, the two strips are shown thick. Consider the wedge formed in between strips 1 and 2. If the interference pattern because of the two waves reflected from wedge surface is observed, then from the observed data we can compute thickness of paper, refractive index of the medium filled in wedge, number of bonds formed, etc. Considre the strips to be thick as compared to wavelength of ligth and light is incident normally. Neglect the effect due to reflection from top surface of strip 1 and bottom surface of strip 2. Take `L = 5 cm` and `lambda_(air) = 40 nm`. For data in question53 determine the distance of point B from the 20th dark band. Counting of dark point has to start from the contact point.A. 4 cmB. 3 cmC. 5 cmD. 2cm
Answer» Correct Answer - a For 20th dark band, `x = 20 xx 5 xx 10^(-4) m = 1 m` So, required separation `= S - 1 = 4 cm`

Discussion

No Comment Found

Related InterviewSolutions

Angular width of central maxima in the Fraunhofer diffraction pattern of a slit is measured. The slit is illuminated by light of wavelength `6000Å`. When the slit is illuminated by light of another wavelength, the angular width decreases by 30%. The wavelength of this light will beA. `3500 Å`B. `4200 Å`C. `4700 Å`D. `6000 Å`
Find the half angular width of the central bright maximum in the fraunhofer diffraction pattern of a slit of width `12xx10^(-5)cm` when the slit is illuminated by monochromatic light of wavelength 6000 Å.
Find the half angular width of the central bright maximum in the fraunhofer diffraction pattern of a slit of width `12xx10^(-5)cm` when the slit is illuminated by monochromatic light of wavelength 6000 Å.A. `40^(@)`B. `45^(@)`C. `30^(@)`D. `60^(@)`
In a single slit diffraction, the width of slits is `0.5cm`, focal length of lens is 40 cm and of first dark fringe is
What will be the angular width of central maxima in Fraunhofer diffraction when light of wavelength `6000Å` is used and slit width is `12xx10^-5cm`?A. (a) `2rad`B. (b) `3rad`C. (c) `1rad`D. (d) `8rad`
A light wave is incident normally over a slit of width `24xx10^-5cm`. The angular position of second dark fringe from the central maxima is `30^@`. What is the wavelength of light?A. `6000 Å`B. `5000 Å`C. `3000 Å`D. `1500 Å`
Light of wavelength `6328 Å` is incident normally on a slit of width 0.2 mm. Angular width of the central maximum on the screen will be :A. `0.9^(@)`B. `0.18^(@)`C. `0.54^(@)`D. `0.36^(@)`
Light of wavelength `6328 Å` is incident normally on a slit of width 0.2 mm. Angular width of the central maximum on the screen will be :A. `0.36^(@)`B. `0.18^(@)`C. `0.72^(@)`D. `0.09^(@)`
Light wavelength 6000 Å is incident normally on a slit of width `24xx10^(-5)` cm. find out the angular position of seconds minimum from central maximum?A. `12 xx 10^(-5)cm`B. `18xx10^(-5)cm`C. `24xx10^(-5)cm`D. `36xx10^(-5)cm`
Light wavelength 6000 Å is incident normally on a slit of width `24xx10^(-5)` cm. find out the angular position of seconds minimum from central maximum?

Discussion

No Comment Found

Related InterviewSolutions

Reply to Comment