82 + Interview Questions in Electron And Ion Spectrometers in Analytical Instrumentation Page 2 InterviewSolution

51.	In Ion spectroscopy, the primary ion is usually which of the following?(a) Inert gas ion(b) Halogen ion(c) Oxygen group gas ion(d) HydrogenThe question was asked at a job interview.The above asked question is from Ion Spectroscopy topic in chapter Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct answer is (a) INERT GAS ION Explanation: In Ion spectroscopy, the primary ion is usually an inert gas ion. When primary ion having particular kinetic energy is incident on a SURFACE CERTAIN phenomena can occur.

Discussion

52.	In Auger spectroscopy, beam currents are typically _____ in a beam of diameter 0.5mm.(a) 5-10 µA(b) 5-20 µA(c) 5-30 µA(d) 5-50 µAI have been asked this question in final exam.This interesting question is from Auger Electron Spectroscopy in division Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct answer is (d) 5-50 µA For EXPLANATION: In Auger SPECTROSCOPY, BEAM CURRENTS are TYPICALLY 5-50 µA in a beam of diameter 0.5mm. Auger and X-ray emission are competitive processes.

Discussion

53.	Auger electron spectroscopy involves the irradiation of the surface to be analysed with a beam of electrons of energy in the _________ range.(a) 1-2 KeV(b) 2-4 KeV(c) 4-8 KeV(d) 1-8 KeVThis question was addressed to me in semester exam.The query is from Auger Electron Spectroscopy in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right option is (a) 1-2 KEV The EXPLANATION is: Auger electron SPECTROSCOPY involves the irradiation of the surface to be analysed with a beam of electrons of energy in the 1-2 KeV range. Auger and X-ray emission are competitive PROCESSES.

Discussion

54.	Which of the following is the detection limit of Auger Electron Spectroscopy?(a) 0.1% monolayer(b) 0.5% monolayer(c) 1% monolayer(d) 2% monolayerThis question was addressed to me in an internship interview.This interesting question is from Auger Electron Spectroscopy in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct CHOICE is (B) 0.5% monolayer Explanation: The detection limit of AES is 0.5% monolayer. It has 0.5µ x-y resolution.

Discussion

55.	In ESCA process, the photon ejects which of the following?(a) 1s electron(b) 1p electron(c) 2s electron(d) 2p electronI have been asked this question in a national level competition.Question is from Auger Electron Spectroscopy topic in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» CORRECT option is (a) 1s electron For EXPLANATION I WOULD say: In ESCA PROCESS, the photon ejects 1s electron. For X-ray, an electron drops from the 2p orbit.

Discussion

56.	Electron spectroscopy is based on the ionization phenomenon.(a) True(b) FalseI have been asked this question in an interview for job.Query is from Electron Spectroscopy for Chemical Analysis in division Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right CHOICE is (a) True Easy EXPLANATION: Electron SPECTROSCOPY is based on the IONIZATION phenomenon. It can be ionization of photon or electron.

Discussion

57.	Surface is usually more than _____ atomic layer deep and is a region of ________ atomic potentials.(a) One, uniform(b) One, non-uniform(c) Two, uniform(d) Two, non-uniformI had been asked this question during an internship interview.This interesting question is from Surface Spectroscopic Techniques in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Correct option is (b) One, non-uniform Explanation: Surface is more than one ATOMIC LAYER deep and is a region of non-uniform atomic POTENTIALS. The outermost layer of atoms is CALLED a surface.

Discussion

58.	The fragments formed during sputtering can be either neutral atoms or ions. The ions can only be positive.(a) True(b) FalseThis question was addressed to me in semester exam.My question comes from Ion Spectroscopy in division Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct CHOICE is (b) False The best I can EXPLAIN: The FRAGMENTS FORMED during sputtering can be either neutral atoms or ions. The ions can be positive or negative.

Discussion

59.	Which of the following is the most commonly used magnetic shielding?(a) Helmholtz coils(b) Ferro-magnetic shielding(c) Faraday shield(d) Magnetometer probeThis question was posed to me in an interview.My question is based upon Instrumentation for Electron Spectroscopy topic in division Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The CORRECT choice is (B) Ferro-magnetic shielding For EXPLANATION: Ferro-magnetic shielding is the most COMMONLY used magnetic shielding. Helmholtz coil can be used as alternative.

Discussion

60.	Which of the following is the most commonly used detector in ESCA and AES?(a) Electron multiplier(b) Dynodes(c) Photovoltaic cell(d) PhotomultiplierThe question was posed to me in an interview for internship.This question is from Instrumentation for Electron Spectroscopy topic in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The CORRECT answer is (a) Electron multiplier To explain: Electron multiplier is the most commonly used DETECTORS in ESCA and AES. It is similar to photomultiplier.

Discussion

61.	In spherical sector analyser, __________ is detected and plotted as a function of energy.(a) Mass(b) Charge(c) Number of electrons striking the detector(d) Mass to charge ratioThis question was posed to me in class test.This intriguing question originated from Instrumentation for Electron Spectroscopy in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The CORRECT choice is (C) Number of electrons striking the detector Easy EXPLANATION: In spherical sector analyser, the number of electrons striking the detector is DETECTED and plotted as a function of ENERGY. It is detected for a constant potential.

Discussion

62.	Double-pass cylindrical mirror energy analyser has how many mirrors?(a) One(b) Two(c) Three(d) FourI got this question in exam.I need to ask this question from Instrumentation for Electron Spectroscopy in chapter Electron and Ion Spectrometers of Analytical Instrumentation
Answer» RIGHT choice is (b) TWO Explanation: Double-pass CYLINDRICAL mirror energy ANALYSER has two mirrors. It is commonly used in electron SPECTROSCOPY.

Discussion

63.	AES is limited when it comes to very high resolution studies.(a) True(b) FalseI have been asked this question in an online quiz.My question is based upon Auger Electron Spectroscopy in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct CHOICE is (a) True To explain: AES is limited when it comes to very HIGH resolution studies. It is very characteristic for VARIOUS ELEMENTS.

Discussion

64.	532.5 eV matches which of the following specific atom type?(a) Carbon(b) Oxygen(c) Nitrogen(d) ArgonThis question was addressed to me in examination.Origin of the question is Electron Spectroscopy for Chemical Analysis topic in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct choice is (b) Oxygen The best I can explain: Each energy MATCHES a SPECIFIC ATOM type. 532.5 eV matches CARBON.

Discussion

65.	ESCA gives sufficient chemical information up to a depth about ________ armstrong in polymers.(a) 5-20(b) 15-40(c) 40-100(d) 100-200This question was addressed to me in my homework.Query is from Electron Spectroscopy for Chemical Analysis topic in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct option is (c) 40-100 Best explanation: ESCA GIVES sufficient chemical INFORMATION up to a depth about 40-100 armstrong in polymers. ESCA is also KNOWN as X-ray photoelectron spectroscopy.

Discussion

66.	Surface analysis can provide information that classic methods like microscopic cannot.(a) True(b) FalseThis question was posed to me in exam.This interesting question is from Surface Spectroscopic Techniques topic in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The CORRECT answer is (a) True For explanation: Surface analysis can provide information that classic methods like MICROSCOPIC cannot. It is better than reflectivity, ADSORPTION isotherms, ETC.

Discussion

67.	If the primary ion is elastically scattered, the kinetic energy of the reflected primary ion will depend on which of the following?(a) Charge of the primary ion(b) Charge of the surface ion(c) Mass of the surface ion(d) Number of surface ionsI got this question in unit test.The origin of the question is Ion Spectroscopy topic in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The CORRECT option is (C) Mass of the surface ION To explain I would say: If the primary ion is elastically SCATTERED, the KINETIC energy of the reflected primary ion will depend on the mass of the surface ion. The reflected ion is measured by ISS.

Discussion

68.	Electron detector has a _______ doped glass tube with a secondary semiconducting coating.(a) Quartz(b) Silica(c) Lead(d) CesiumThe question was asked by my college professor while I was bunking the class.The query is from Instrumentation for Electron Spectroscopy topic in division Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right OPTION is (c) Lead For explanation: Electron DETECTOR has a lead doped glass tube with a SECONDARY SEMICONDUCTING coating. It has a high secondary electron SHIELD.

Discussion

69.	Which of the following must be used with the X-ray source to have high energy resolution?(a) Chopper(b) Vacuum chamber(c) Accelerator(d) MonochromatorThe question was posed to me by my college professor while I was bunking the class.I want to ask this question from Instrumentation for Electron Spectroscopy topic in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right CHOICE is (d) MONOCHROMATOR Explanation: Monochromator must be USED with the X-ray source to have high energy RESOLUTION. It will also REMOVE the satellite lines.

Discussion

70.	How is the specificity of Auger electron spectroscopy?(a) Very bad(b) Bad(c) Good(d) Very goodI got this question in unit test.My enquiry is from Auger Electron Spectroscopy topic in division Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The CORRECT option is (C) Good The EXPLANATION is: The specificity of Auger ELECTRON spectroscopy is good. ESCA has very good specificity.

Discussion

71.	Charging effect can be suppressed by supplying flood of electrons having which of the following?(a) Uniform low energy(b) Uniform low mass(c) Uniform high energy(d) Uniform high massI have been asked this question by my college director while I was bunking the class.Question is taken from Instrumentation for Electron Spectroscopy in chapter Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct answer is (a) Uniform low energy To EXPLAIN: Charging effect can be suppressed by supplying FLOOD of electrons having uniform low energy. It ALSO RESULTS in attainment of additional USEFUL information.

Discussion

72.	AES is more sensitive than XPS because of which of the following factors?(a) Binding energies of electrons(b) Kinetic energies of electrons(c) Mass of electrons(d) Mass to charge ratio of electronsI have been asked this question during a job interview.I'm obligated to ask this question of Auger Electron Spectroscopy topic in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct option is (b) Kinetic energies of electrons For explanation: AES is more SENSITIVE than XPS because of the difference in kinetic energies of electrons. ION etching is SOMETIMES NECESSARY for AES.

Discussion

73.	Electron ionisation can produce ESCA electrons.(a) True(b) FalseThis question was addressed to me in semester exam.My question is based upon Auger Electron Spectroscopy topic in division Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right choice is (b) False To explain I WOULD SAY: Electron ionisation cannot PRODUCE ESCA electrons. It can produce only Auger electrons.

Discussion

74.	In the spectrum, two main peaks at _________ and ________ are observed.(a) 284.6, 532.5(b) 248.6, 523.5(c) 264.8, 535.2(d) 246.8, 553.2I had been asked this question in an interview.My enquiry is from Electron Spectroscopy for Chemical Analysis in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct ANSWER is (a) 284.6, 532.5 For explanation I would say: In the SPECTRUM, two main peaks at 284.6 and 532.5 are OBSERVED. The unit for counting energy is electron-volt.

Discussion

75.	ESCA can identify elements in the periodic table above which of the following?(a) Carbon(b) Boron(c) Helium(d) PotassiumThe question was asked in my homework.My doubt is from Electron Spectroscopy for Chemical Analysis topic in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct CHOICE is (C) Helium The explanation is: ESCA can identify elements in the periodic table above helium. Adjacent elements are clearly DISTINGUISHED.

Discussion

76.	Which of the following methods utilizes the emission of low energy electrons in a process?(a) Auger electron spectroscopy(b) Electron impact spectroscopy(c) Electron spectroscopy for chemical analysis(d) Secondary ion mass spectroscopyI had been asked this question in quiz.Origin of the question is Surface Spectroscopic Techniques topic in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct OPTION is (a) Auger electron spectroscopy The best explanation: Auger electron spectroscopy UTILIZES the emission of low energy ELECTRONS in auger process. It is ONE of the commonly EMPLOYED techniques.

Discussion

77.	In Auger process, an electron drops to fill which of the following?(a) 1s hole(b) 1p hole(c) 2s hole(d) 2p holeThis question was posed to me in my homework.This intriguing question comes from Auger Electron Spectroscopy in division Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Correct choice is (a) 1s hole Easy EXPLANATION: In Auger process, an ELECTRON drops to fill 1s hole. It EXPELS a 2p electron.

Discussion

78.	A basic X-ray source includes which of the following components?(a) Large target anode(b) Large target cathode(c) Small target anode(d) Small target cathodeThis question was posed to me in an online interview.The question is from Instrumentation for Electron Spectroscopy in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right ANSWER is (a) Large TARGET anode The EXPLANATION: A basic X-ray source includes a large target anode. It also has a heating ELEMENT.

Discussion

79.	Which of the following is the abbreviation of SIMS?(a) Secondary ion mass spectroscopy(b) Spectrum ionization mass spectroscopy(c) Scattering ions mass spectroscopy(d) Spectral ionization mass spectroscopyThis question was posed to me by my school principal while I was bunking the class.The query is from Surface Spectroscopic Techniques in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right choice is (a) SECONDARY ion MASS SPECTROSCOPY Easy explanation: Secondary ion mass spectroscopy is the abbreviation of SIMS. It is a type of ion spectroscopy.

Discussion

80.	Which of the following is the ideal vacuum for electron spectrometers?(a) 10^-6 torr(b) 10^-7 torr(c) 10^-8 torr(d) 10^-9 torrI had been asked this question during an online exam.The question is from Instrumentation for Electron Spectroscopy in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The CORRECT ANSWER is (a) 10^-6 TORR To elaborate: 10^-6 torr is the ideal vacuum for electron SPECTROMETERS. Vacuum below 10^-6 torr can ALSO be used.

Discussion

81.	Which of the following methods use soft X-rays to eject electrons from inner shell orbitals?(a) Auger electron spectroscopy(b) Electron impact spectroscopy(c) Electron spectroscopy for chemical analysis(d) Secondary ion mass spectroscopyThis question was addressed to me in a national level competition.My doubt stems from Surface Spectroscopic Techniques in chapter Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct option is (c) Electron spectroscopy for CHEMICAL analysis To explain I would SAY: Electron spectroscopy for chemical analysis using SOFT X-rays to eject electrons from inner shell orbitals. It is a type of electron spectroscopy.

Discussion

82.	Which of the following is a type of electron spectroscopy?(a) MIKES(b) Auger spectroscopy(c) Secondary ion mass spectroscopy(d) Ion scattering spectroscopyThe question was asked in an interview.Enquiry is from Surface Spectroscopic Techniques in division Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Correct option is (B) Auger SPECTROSCOPY Easiest EXPLANATION: Auger spectroscopy is a TYPE of electron spectroscopy. Electron spectroscopy for chemical analysis is ALSO a type of electron spectroscopy.

Discussion

Explore topic-wise InterviewSolutions in .

Electron spectroscopy is based on the ionization phenomenon.(a) True(b) FalseI have been asked this question in an interview for job.Query is from Electron Spectroscopy for Chemical Analysis in division Electron and Ion Spectrometers of Analytical Instrumentation

The fragments formed during sputtering can be either neutral atoms or ions. The ions can only be positive.(a) True(b) FalseThis question was addressed to me in semester exam.My question comes from Ion Spectroscopy in division Electron and Ion Spectrometers of Analytical Instrumentation

Double-pass cylindrical mirror energy analyser has how many mirrors?(a) One(b) Two(c) Three(d) FourI got this question in exam.I need to ask this question from Instrumentation for Electron Spectroscopy in chapter Electron and Ion Spectrometers of Analytical Instrumentation

AES is limited when it comes to very high resolution studies.(a) True(b) FalseI have been asked this question in an online quiz.My question is based upon Auger Electron Spectroscopy in section Electron and Ion Spectrometers of Analytical Instrumentation

532.5 eV matches which of the following specific atom type?(a) Carbon(b) Oxygen(c) Nitrogen(d) ArgonThis question was addressed to me in examination.Origin of the question is Electron Spectroscopy for Chemical Analysis topic in portion Electron and Ion Spectrometers of Analytical Instrumentation

Surface analysis can provide information that classic methods like microscopic cannot.(a) True(b) FalseThis question was posed to me in exam.This interesting question is from Surface Spectroscopic Techniques topic in portion Electron and Ion Spectrometers of Analytical Instrumentation

How is the specificity of Auger electron spectroscopy?(a) Very bad(b) Bad(c) Good(d) Very goodI got this question in unit test.My enquiry is from Auger Electron Spectroscopy topic in division Electron and Ion Spectrometers of Analytical Instrumentation

Electron ionisation can produce ESCA electrons.(a) True(b) FalseThis question was addressed to me in semester exam.My question is based upon Auger Electron Spectroscopy topic in division Electron and Ion Spectrometers of Analytical Instrumentation

In the spectrum, two main peaks at _ and are observed.(a) 284.6, 532.5(b) 248.6, 523.5(c) 264.8, 535.2(d) 246.8, 553.2I had been asked this question in an interview.My enquiry is from Electron Spectroscopy for Chemical Analysis in portion Electron and Ion Spectrometers of Analytical Instrumentation

ESCA can identify elements in the periodic table above which of the following?(a) Carbon(b) Boron(c) Helium(d) PotassiumThe question was asked in my homework.My doubt is from Electron Spectroscopy for Chemical Analysis topic in portion Electron and Ion Spectrometers of Analytical Instrumentation

In Auger process, an electron drops to fill which of the following?(a) 1s hole(b) 1p hole(c) 2s hole(d) 2p holeThis question was posed to me in my homework.This intriguing question comes from Auger Electron Spectroscopy in division Electron and Ion Spectrometers of Analytical Instrumentation