75 + Interview Questions in X-Ray Spectrometers in Analytical Instrumentation Page 1 InterviewSolution

1.	In powder diffractometer, the sharpness of the lines is greatly determined by which of the following?(a) Quality of the sample, size of the slit(b) Quality of the slit, size of the sample(c) Thickness of the slit, amount of the sample(d) Number of slits, composition of the sampleI got this question in my homework.The origin of the question is X-Ray Diffractometers topic in division X-Ray Spectrometers of Analytical Instrumentation
Answer» The correct answer is (B) Quality of the SLIT, size of the SAMPLE The best explanation: In powder diffractometer, the sharpness of the lines is greatly determined by the quality of the slit and the size of the sample. The slit should be able to produce a fine beam.

Discussion

2.	The applications of X-ray absorption meters are limited when compared with X-ray emission procedures.(a) True(b) FalseThe question was posed to me in quiz.The question is from X-Ray Absorption Meter in portion X-Ray Spectrometers of Analytical Instrumentation
Answer» The correct choice is (a) True The best I can explain: The applications of X-ray ABSORPTION METERS are limited when COMPARED with X-ray emission procedures. They are also limited when compared with FLUORESCENCE procedures.

Discussion

3.	The measurement of intensity of fluorescent X-rays provide a simple and ____________ way of _____________ analysis.(a) Destructive, quantitative(b) Non-destructive, quantitative(c) Destructive, qualitative(d) Non-destructive, qualitativeThis question was addressed to me by my college director while I was bunking the class.The query is from X-Ray Fluorescence Spectrometry topic in chapter X-Ray Spectrometers of Analytical Instrumentation
Answer» Correct OPTION is (B) Non-destructive, quantitative The EXPLANATION: The measurement of an intensity of fluorescent X-rays provide a SIMPLE and non-destructive way of quantitative ANALYSIS.

Discussion

4.	Fluorescent X-ray spectrometers would require only moderate-intensity X-ray tubes.(a) True(b) FalseI have been asked this question in final exam.I want to ask this question from X-Ray Fluorescence Spectrometry in section X-Ray Spectrometers of Analytical Instrumentation
Answer» The correct option is (B) False To EXPLAIN: Fluorescent X-ray spectrometers WOULD require high-intensity X-ray tubes. They ALSO require sensitive detectors and suitable X-ray optics.

Discussion

5.	In Energy dispersive system, the energy level and the number of pulses is related to which of the following?(a) Amount of sample, element involved(b) Element involved, concentration of the element(c) Concentration of the element, element involved(d) Number of atoms, amount of sampleThe question was posed to me during an interview.My question comes from X-Ray Fluorescent Spectrometer in section X-Ray Spectrometers of Analytical Instrumentation
Answer» The correct choice is (b) Element INVOLVED, concentration of the element For explanation I WOULD say: In Energy DISPERSIVE system, the energy level is related to the element involved. The NUMBER of pulses is related to the concentration of the element involved.

Discussion

6.	X-ray diffractometers provide ____________ information about the compounds present in a solid sample.(a) Quantitative(b) Qualitative(c) Quantitative and qualitative(d) Either quantitative or qualitativeI had been asked this question at a job interview.My enquiry is from X-Ray Diffractometers in division X-Ray Spectrometers of Analytical Instrumentation
Answer» Correct option is (c) Quantitative and qualitative The best EXPLANATION: X-ray DIFFRACTOMETERS provide quantitative and qualitative information about the COMPOUNDS present in a solid SAMPLE.

Discussion

7.	The x-ray beam produced by the primary x-ray tube passes through which of the following components to produce the incident radiation?(a) Detector(b) Slit-collimator arrangement(c) Sample reflector(d) MonochromatorI had been asked this question by my college professor while I was bunking the class.My doubt stems from Total Reflection X-Ray Fluorescence Spectrometer topic in portion X-Ray Spectrometers of Analytical Instrumentation
Answer» The CORRECT answer is (B) Slit-collimator arrangement The BEST explanation: The x-ray BEAM produced by the primary x-ray tube passes through the slit-collimator arrangement. This FORMS the incident radiation.

Discussion

8.	Which of the following devices are used as a detector?(a) Thermistor(b) Optical detector(c) Solid state detector(d) Golay cellThe question was asked in quiz.I would like to ask this question from Total Reflection X-Ray Fluorescence Spectrometer topic in section X-Ray Spectrometers of Analytical Instrumentation
Answer» RIGHT CHOICE is (c) Solid STATE detector Explanation: The detection system comprises of peltier cooled solid state detector. It also has a spectroscopy AMPLIFIER.

Discussion

9.	How can the resolution of the collimator be increased?(a) By reducing the separation between the metal plates of the collimator(b) By increasing the separation between the metal plates of the collimator(c) By increasing the number of metal plates(d) By decreasing the number of metal platesThe question was posed to me in homework.Query is from Instrumentation of X-Ray Spectroscopy topic in chapter X-Ray Spectrometers of Analytical Instrumentation
Answer» The correct ANSWER is (a) By reducing the SEPARATION between the metal PLATES of the collimator The best explanation: The resolution of the collimator can be increased by reducing the separation between the metal plates of the collimator. Collimator has a series of closely spaced PARALLEL metal plates.

Discussion

10.	When compared to filters, monochromators provide much signal to noise ratio.(a) True(b) FalseI had been asked this question in an internship interview.I would like to ask this question from Instrumentation of X-Ray Spectroscopy in section X-Ray Spectrometers of Analytical Instrumentation
Answer» Correct ANSWER is (a) True The best I can explain: When COMPARED to FILTERS, monochromators provide much signal to NOISE ratio. Monochromators are used for removal of unwanted wavelengths.

Discussion

11.	In curved crystal arrangement, angular velocity of the crystal is twice that of the detector.(a) True(b) FalseThis question was addressed to me during a job interview.The doubt is from X-Ray Fluorescent Spectrometer in section X-Ray Spectrometers of Analytical Instrumentation
Answer» Right option is (B) False The explanation is: In curved crystal arrangement, ANGULAR VELOCITY of the detector is twice that of the crystal. This arrangement is suitable for the analysis of SMALL specimens.

Discussion

12.	In total reflection X-ray fluorescence spectrometer, the specimen is excited by the primary X-ray beam at a grazing angle _______ the critical angle.(a) Greater than(b) Less than(c) Equal to(d) Which is a complement ofI had been asked this question in homework.The query is from Total Reflection X-Ray Fluorescence Spectrometer in portion X-Ray Spectrometers of Analytical Instrumentation
Answer» The correct choice is (b) Less than Easiest explanation: In total reflection X-ray fluorescence SPECTROMETER, the SPECIMEN is EXCITED by the primary X-ray beam at a GRAZING angle less than the critical angle. Total INTERNAL reflection occurs at the critical angle.

Discussion

13.	Which of the following crystals are polished to act as the cut-off reflector?(a) Quartz(b) Beryllium(c) Silicon(d) LithiumThis question was addressed to me during an interview.My doubt is from Total Reflection X-Ray Fluorescence Spectrometer in portion X-Ray Spectrometers of Analytical Instrumentation
Answer» Correct choice is (c) Silicon For explanation: Quartz CRYSTALS are polished to act as the cut-off reflector. It is mounted on the FIRST reflector STAGE.

Discussion

14.	Computer-controlled corrective iteration is the only reliable method of matrix effects correction.(a) True(b) FalseThis question was addressed to me during a job interview.I need to ask this question from Total Reflection X-Ray Fluorescence Spectrometer in division X-Ray Spectrometers of Analytical Instrumentation
Answer» Correct CHOICE is (a) True The EXPLANATION: Computer-controlled CORRECTIVE iteration is the only reliable method of matrix effects correction. This is USED in places where an unknown matrix OCCURS.

Discussion

15.	In X-ray spectrometers, the specimen or the sample is placed after which of the following components?(a) X-ray tube(b) Monochromator(c) Collimator(d) DetectorThis question was addressed to me by my college professor while I was bunking the class.My question is from Instrumentation of X-Ray Spectroscopy topic in chapter X-Ray Spectrometers of Analytical Instrumentation
Answer» CORRECT choice is (a) X-ray TUBE To explain: In X-ray SPECTROMETERS, the specimen or the sample is placed after the X-ray tube. The X-ray tube is the source of the X-ray.

Discussion

16.	With the help of which of the following equations is the distance calculated from a known wavelength of the source and measured angle?(a) Coolidge equation(b) Bragg’s equation(c) Debye equation(d) Scherrer equationThis question was posed to me in class test.My question is taken from X-Ray Diffractometers in division X-Ray Spectrometers of Analytical Instrumentation
Answer» CORRECT option is (b) Bragg’s equation Explanation: The DISTANCE is calculated from a known wavelength of the source and measured ANGLE using Bragg’ equation. The DIFFRACTED angle is calculated by the SPACING between a particular set of plane.

Discussion

17.	When x-rays emitted from molybdenum are allowed to pass through a zirconium filter, which of the following occurs?(a) It absorbs radiation of shorter wavelength(b) It absorbs radiation of longer wavelength(c) It allows radiation of shorter wavelength to pass through(d) It allows radiation in a particular band to pass throughI had been asked this question in homework.This intriguing question originated from Instrumentation of X-Ray Spectroscopy in section X-Ray Spectrometers of Analytical Instrumentation
Answer» Right CHOICE is (b) It absorbs radiation of LONGER WAVELENGTH The EXPLANATION is: When x-rays emitted from molybdenum are allowed to pass through a zirconium filter, it absorbs radiation of shorter wavelength. It allows radiation of a stronger wavelength to pass through.

Discussion

18.	In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _________ of lines and their relative ___________(a) Number, length(b) Number, intensity(c) Position, length(d) Position, intensityI have been asked this question in an online interview.This key question is from X-Ray Diffractometers in portion X-Ray Spectrometers of Analytical Instrumentation
Answer» Correct choice is (d) POSITION, intensity To explain: The identification of a component of the from its powder DIFFRACTION pattern is based UPON the position of lines and their relative intensities. Diffractometers are USED for powder diffraction.

Discussion

19.	In absorption meter, which of the following is placed between the cell and the X-ray tube?(a) Collimator(b) Filter(c) Chopper(d) AttenuatorI got this question in a national level competition.I'm obligated to ask this question of X-Ray Absorption Meter in division X-Ray Spectrometers of Analytical Instrumentation
Answer» Right option is (c) Chopper To EXPLAIN: In ABSORPTION meter, chopper is PLACED between the cell and the X-ray TUBE. It INTERRUPTS the half of the X-ray beam.

Discussion

20.	The electrons are accelerated by voltages in which of the following ranges?(a) 5 and 50kV(b) 50 and 500kV(c) 500 and 5000kV(d) 25 and 250kVI have been asked this question by my school principal while I was bunking the class.My doubt is from Electron Probe Microanalyser topic in portion X-Ray Spectrometers of Analytical Instrumentation
Answer» CORRECT OPTION is (a) 5 and 50kV For explanation: The whole system operates in a vacuum. The ELECTRONS are accelerated by VOLTAGES in the range of 5 and 50kV.

Discussion

21.	In Diffractometers, the intensities of the diffraction peaks of a given compound in a mixture are proportional to the fraction of the material in the mixture.(a) True(b) FalseThis question was posed to me in an international level competition.The above asked question is from X-Ray Diffractometers topic in portion X-Ray Spectrometers of Analytical Instrumentation
Answer» Right CHOICE is (a) True Easy explanation: In Diffractometers, the INTENSITIES of the diffraction peaks of a GIVEN compound in a MIXTURE are proportional to the fraction of the MATERIAL in the mixture. Hence, they are used in qualitative analysis.

Discussion

22.	In absorption meter, the two halves of the X-ray beam are allowed to fall on which of the following components?(a) Collimator(b) Filter(c) Photomultiplier tube(d) AttenuatorThe question was posed to me in exam.This key question is from X-Ray Absorption Meter topic in portion X-Ray Spectrometers of Analytical Instrumentation
Answer» The correct choice is (c) Photomultiplier TUBE To elaborate: In absorption meter, the TWO halves of the X-ray beam are allowed to FALL on the photomultiplier tube. One beam PASSES through the sample and the other beam passes through the reference.

Discussion

23.	The photomultiplier tube used is absorption meter is coated with which of the following materials?(a) Sodium(b) Potassium(c) Phosphorous(d) ChlorineThe question was posed to me in an online quiz.My doubt stems from X-Ray Absorption Meter in section X-Ray Spectrometers of Analytical Instrumentation
Answer» Correct choice is (C) Phosphorous For EXPLANATION I would say: The photomultiplier tube used is ABSORPTION meter is coated with phosphorous. Only ONE photomultiplier tube is commonly present for both the BEAMS.

Discussion

24.	X-ray diffractometers are not used to identify the physical properties of which of the following?(a) Metals(b) Liquids(c) Polymeric materials(d) SolidsThis question was posed to me by my college director while I was bunking the class.I'm obligated to ask this question of X-Ray Diffractometers in section X-Ray Spectrometers of Analytical Instrumentation
Answer» The correct answer is (B) Liquids To EXPLAIN I WOULD say: X-ray diffractometers are not used to identify the physical properties of liquids. It is used to identify the physical properties of METALS, SOLIDS and polymeric materials.

Discussion

25.	Which of the following components are used to generate X-rays?(a) Meyer tube(b) West tube(c) Anger tube(d) Coolidge tubeI have been asked this question by my school principal while I was bunking the class.Query is from Instrumentation of X-Ray Spectroscopy in portion X-Ray Spectrometers of Analytical Instrumentation
Answer» The CORRECT choice is (d) COOLIDGE tube Explanation: Coolidge tube is used to generate X-rays. It the source of X-rays. Coolidge tube requires stabilised current and HIGH VOLTAGE.

Discussion

26.	In absorption meter, the change in thickness of aluminium required for different samples is a function of the difference in which of the following parameters?(a) Amount(b) Concentration(c) Colour(d) CompositionThe question was asked in an international level competition.Question is from X-Ray Absorption Meter in section X-Ray Spectrometers of Analytical Instrumentation
Answer» Correct answer is (d) Composition Easiest explanation: In absorption meter, the change in THICKNESS of aluminium required for DIFFERENT samples is a function of the difference in composition. A VARIABLE thickness attenuator used ALLOWS this function.

Discussion

27.	If the absorption of electromagnetic radiation by matter results in the emission of radiation of the same or longer wavelengths for a short time, the phenomenon is termed as which of the following?(a) Luminescence(b) Fluorescence(c) Phosphorescence(d) Spontaneous emissionI got this question in an online interview.This question is from X-Ray Fluorescence Spectrometry in portion X-Ray Spectrometers of Analytical Instrumentation
Answer» The correct choice is (b) Fluorescence Explanation: If the ABSORPTION of electromagnetic radiation by matter results in the EMISSION of radiation of the same or longer wavelengths for a short TIME, the phenomenon is TERMED as fluorescence. Fluorescence emissions are characteristic of the PARTICULAR element.

Discussion

28.	The energy of the emitted X-rays depends upon the _________ of the atom and their intensity depends upon the __________(a) Atomic number, amount of sample(b) Mass number, amount of sample(c) Mass number, concentration of atoms(d) Atomic number, concentration of atomsI have been asked this question in class test.This intriguing question originated from X-Ray Fluorescence Spectrometry in division X-Ray Spectrometers of Analytical Instrumentation
Answer» RIGHT choice is (d) Atomic number, concentration of atoms To explain: The energy of the emitted X-rays DEPENDS upon the atomic number of the atom and their INTENSITY depends upon the concentration of atoms in the SAMPLE. X-ray fluorescence spectroscopy is based on this PRINCIPLE.

Discussion

29.	The suppression of high energy bremsstrahlung radiation improves which of the following?(a) Signal to background ratio(b) Accuracy(c) Sensitivity(d) CoherenceI had been asked this question in an online quiz.My question is based upon Total Reflection X-Ray Fluorescence Spectrometer in section X-Ray Spectrometers of Analytical Instrumentation
Answer» The correct option is (a) SIGNAL to background ratio The best explanation: The suppression of HIGH ENERGY bremsstrahlung radiation improves the signal to background ratio.Hence, it is performed in total reflection X-ray FLUORESCENCE spectrometer.

Discussion

30.	Which of the following happens when a large solid angle is intercepted as the detector is placed close to the sample?(a) Maximum efficiency increases(b) Maximum efficiency decreases(c) Efficiency is not affected(d) Process response becomes fastThis question was addressed to me in a national level competition.Question is from Total Reflection X-Ray Fluorescence Spectrometer topic in portion X-Ray Spectrometers of Analytical Instrumentation
Answer» Correct answer is (a) MAXIMUM efficiency increases Explanation: When the detector is PLACED very CLOSE to the sample, the maximum efficiency increases. This is because large ANGLE is INTERCEPTED.

Discussion

31.	Which of the following components are used as the sample carrier?(a) Curvette(b) Flask(c) Capillary tube(d) Float glassThe question was posed to me in homework.My question is taken from Total Reflection X-Ray Fluorescence Spectrometer in chapter X-Ray Spectrometers of Analytical Instrumentation
Answer» The correct option is (d) Float glass The BEST explanation: Float glass is USED as the sample carrier. It is mounted as the second REFLECTOR STAGE.

Discussion

32.	The cathode in the Coolidge tube is kept in an inclined manner.(a) True(b) FalseI had been asked this question during an interview.This question is from Instrumentation of X-Ray Spectroscopy in division X-Ray Spectrometers of Analytical Instrumentation
Answer» Right option is (B) False Explanation: The anode in the COOLIDGE TUBE is kept in an inclined manner. The anode is MADE of copper.

Discussion

33.	Given below is the block diagram of X-ray spectrometer. Identify the unmarked component.(a) Filter(b) Monochromator(c) Specimen(d) AmplifierI got this question in examination.The above asked question is from Instrumentation of X-Ray Spectroscopy in chapter X-Ray Spectrometers of Analytical Instrumentation
Answer» The correct choice is (c) Specimen To ELABORATE: The UNMARKED COMPONENT is specimen. It is the SAMPLE under analysis.

Discussion

34.	In Diffractometers, line intensities depend on ______ and kind of atomic reflection centres in each set of plates.(a) Number(b) Position(c) Length(d) Distance between linesThe question was posed to me in an interview for job.My doubt is from X-Ray Diffractometers topic in division X-Ray Spectrometers of Analytical Instrumentation
Answer» The CORRECT ANSWER is (a) Number Explanation: In DIFFRACTOMETERS, line intensities depend on number and KIND of atomic REFLECTION centres in each set of plates. Diffraction is a wave property of electromagnetic radiation.

Discussion

35.	The analysis of X-ray beam by diffraction is similar to spectrum analysis carried out with a diffraction grating.(a) True(b) FalseThis question was posed to me in quiz.The above asked question is from X-Ray Fluorescent Spectrometer topic in section X-Ray Spectrometers of Analytical Instrumentation
Answer» RIGHT OPTION is (a) True The best explanation: The analysis of X-ray BEAM by diffraction is similar to spectrum analysis CARRIED out with a diffraction grating. WAVELENGTH dispersive type of meter derives its name from this fact.

Discussion

36.	In computer-controlled corrective iteration method, which of the following is used to estimate absorption corrections?(a) Initial raw intensity data(b) Elemental composition(c) Amount of sample(d) Amount of radiationThe question was asked during an online exam.This intriguing question originated from Total Reflection X-Ray Fluorescence Spectrometer in portion X-Ray Spectrometers of Analytical Instrumentation
Answer» Right answer is (a) Initial raw INTENSITY data The BEST explanation: In the computer-controlled corrective iteration method, initial raw intensity data is USED to estimate absorption corrections. Elemental COMPOSITION is used to calculate absorption corrections.

Discussion

37.	The x-rays generated come out of the Coolidge tube through which of the following?(a) Beryllium window(b) Tungsten window(c) Collimator(d) Target materialI have been asked this question in a job interview.Question is from Instrumentation of X-Ray Spectroscopy topic in division X-Ray Spectrometers of Analytical Instrumentation
Answer» RIGHT CHOICE is (a) BERYLLIUM window The best EXPLANATION: The x-rays generated come out of the Coolidge tube through a beryllium window. Some energy is lost as heat.

Discussion

38.	X-ray absorption meters have which of the following major disadvantages?(a) Low accuracy(b) Low range(c) Low sensitivity(d) It is destructiveI got this question in an international level competition.My question is from X-Ray Absorption Meter topic in chapter X-Ray Spectrometers of Analytical Instrumentation
Answer» CORRECT answer is (c) LOW SENSITIVITY The explanation is: Absorption meters GIVE information about the ABSORBING material. X-ray absorption meters have low sensitivity.

Discussion

39.	Which of the following is Mosely’s equation if ‘C’ is the speed of light, ‘a’ is proportionality constant, ‘σ’ is a constant which depends on electronic transition series, ‘Z’ is the atomic number and ‘λ’ is the wavelength?(a) Cλ= a(Z-σ)^2(b) C/λ= a(Z-σ)^2(c) C(Z-σ)^2= aλ(d) C(Z-σ)^2= a/λI have been asked this question in unit test.My doubt stems from X-Ray Fluorescence Spectrometry topic in section X-Ray Spectrometers of Analytical Instrumentation
Answer» The CORRECT option is (b) C/λ= a(Z-σ)^2 For explanation I would say: The Mosely’s equation is, C/λ= a(Z-σ)^2. It GIVES the relationship between the speed of LIGHT, RECIPROCAL of WAVELENGTH and atomic number.

Discussion

40.	The electron optics consists of an electron gun followed by which of the following components?(a) Collimator(b) Slit(c) Amplifier(d) Electron beam probeI have been asked this question in quiz.Origin of the question is Electron Probe Microanalyser in section X-Ray Spectrometers of Analytical Instrumentation
Answer» Right answer is (d) Electron beam PROBE For explanation I WOULD say: The electron optics consists of an electron gun FOLLOWED by an electron beam probe. This is FORMED by two electro-magnetic lenses.

Discussion

41.	Electron probe microanalyser is a method of destructive elemental analysis.(a) True(b) FalseThe question was posed to me in an interview for job.Enquiry is from Electron Probe Microanalyser in section X-Ray Spectrometers of Analytical Instrumentation
Answer» CORRECT ANSWER is (a) True Easiest EXPLANATION: Electron probe microanalyser uses a finely focussed electron beam to excite the X-rays. It is a method of destructive ELEMENTAL ANALYSIS.

Discussion

42.	Which of the following is the effective resolution limit in electron probe microanalyser?(a) 1mm(b) 10mm(c) 100mm(d) 1000mmThis question was addressed to me by my school teacher while I was bunking the class.My question is from Electron Probe Microanalyser in section X-Ray Spectrometers of Analytical Instrumentation
Answer» The correct OPTION is (a) 1mm Best EXPLANATION: The ELECTRONS SPREAD laterally and longitudinally in the sample by approximately 1mm. Hence, the EFFECTIVE resolution limit is 1mm.

Discussion

43.	Which of the following is not a target metal used in the Coolidge tube?(a) Rhodium(b) Cobalt(c) Gold(d) SilverThis question was posed to me in quiz.The above asked question is from Instrumentation of X-Ray Spectroscopy in section X-Ray Spectrometers of Analytical Instrumentation
Answer» Correct choice is (c) GOLD Explanation: Gold is not USED as a target metal in the Coolidge tube. The other target METALS are COPPER, molybdenum and CHROMIUM.

Discussion

44.	Which of the following crystals are not suited for x-ray grating?(a) Topaz(b) Lithium fluoride(c) Calcium fluoride(d) Sodium fluorideI have been asked this question during an interview.I'm obligated to ask this question of Instrumentation of X-Ray Spectroscopy in division X-Ray Spectrometers of Analytical Instrumentation
Answer» The correct answer is (d) Sodium fluoride For EXPLANATION: The CRYSTAL which is not suited for x-ray GRATING is sodium fluoride. Other crystals which are suitable for x-ray grating are GYPSUM and sodium chloride.

Discussion

45.	The crystal used as X-ray grating has _______ dimensional lattice arrays.(a) One(b) Two(c) Three(d) FourI have been asked this question in semester exam.Asked question is from X-Ray Fluorescent Spectrometer in portion X-Ray Spectrometers of Analytical Instrumentation
Answer» Right choice is (c) Three Explanation: The crystal USED as X-ray grating has three dimensional lattice arrays. Photons can be COHERENTLY SCATTERED USING the crystals.

Discussion

46.	Micro probe analyser cannot be used on inhomogeneous material.(a) True(b) FalseI have been asked this question during an online interview.I need to ask this question from Electron Probe Microanalyser in division X-Ray Spectrometers of Analytical Instrumentation
Answer» The correct CHOICE is (b) False Easy explanation: Micro probe analyser can be USED on INHOMOGENEOUS material. It can also be FOCUSSED on a very small area.

Discussion

47.	The major problem associated with sample preparation is which of the following?(a) Preparing sample in the right quantity(b) Choosing sample holders(c) Matrix effects(d) Reflection by holdersI had been asked this question during an interview.This key question is from Total Reflection X-Ray Fluorescence Spectrometer topic in portion X-Ray Spectrometers of Analytical Instrumentation
Answer» Correct option is (C) Matrix effects The explanation is: The MAJOR problem associated with sample preparation is matrix effects. The primary and emitted RADIATION is absorbed by the ELEMENT present ALONG with the elements of interest.

Discussion

48.	X-ray emission must be analysed against a background of _______ radiation.(a) Blue(b) Yellow(c) White(d) GreenThis question was addressed to me by my college professor while I was bunking the class.I would like to ask this question from Electron Probe Microanalyser topic in section X-Ray Spectrometers of Analytical Instrumentation
Answer» The CORRECT OPTION is (C) White The best I can explain: X-ray emission must be analysed against a background of white RADIATION. Microprobe has poorer sensitivity than XRF spectrometer.

Discussion

49.	Which of the following does not make the X-ray tube nearly monochromatic?(a) Transmission-anode X-ray tube(b) Secondary fluorescence target(c) Slit(d) FiltersThis question was posed to me in semester exam.This key question is from X-Ray Fluorescent Spectrometer in portion X-Ray Spectrometers of Analytical Instrumentation
Answer» The correct ANSWER is (c) Slit The EXPLANATION is: Slits do not make the X-ray TUBE nearly monochromatic. The most COMMONLY used source is X-ray tubes.

Discussion

50.	Why is a mono-energetic radiation source required in X-ray fluorescent spectrometer?(a) To provide good sensitivity(b) To provide high accuracy(c) To provide a proper range(d) To reduce unwanted backgroundThis question was posed to me in a national level competition.My doubt is from X-Ray Fluorescent Spectrometer topic in section X-Ray Spectrometers of Analytical Instrumentation
Answer» Correct CHOICE is (d) To reduce unwanted background The best I can EXPLAIN: Mono-energetic radiation source is required in X-ray fluorescent SPECTROMETER to reduce unwanted background. This OCCURS due to the scattering occurring over a broad range of wavelengths.

Discussion

Explore topic-wise InterviewSolutions in .

The applications of X-ray absorption meters are limited when compared with X-ray emission procedures.(a) True(b) FalseThe question was posed to me in quiz.The question is from X-Ray Absorption Meter in portion X-Ray Spectrometers of Analytical Instrumentation

Fluorescent X-ray spectrometers would require only moderate-intensity X-ray tubes.(a) True(b) FalseI have been asked this question in final exam.I want to ask this question from X-Ray Fluorescence Spectrometry in section X-Ray Spectrometers of Analytical Instrumentation

When compared to filters, monochromators provide much signal to noise ratio.(a) True(b) FalseI had been asked this question in an internship interview.I would like to ask this question from Instrumentation of X-Ray Spectroscopy in section X-Ray Spectrometers of Analytical Instrumentation

In curved crystal arrangement, angular velocity of the crystal is twice that of the detector.(a) True(b) FalseThis question was addressed to me during a job interview.The doubt is from X-Ray Fluorescent Spectrometer in section X-Ray Spectrometers of Analytical Instrumentation

The photomultiplier tube used is absorption meter is coated with which of the following materials?(a) Sodium(b) Potassium(c) Phosphorous(d) ChlorineThe question was posed to me in an online quiz.My doubt stems from X-Ray Absorption Meter in section X-Ray Spectrometers of Analytical Instrumentation

Which of the following components are used as the sample carrier?(a) Curvette(b) Flask(c) Capillary tube(d) Float glassThe question was posed to me in homework.My question is taken from Total Reflection X-Ray Fluorescence Spectrometer in chapter X-Ray Spectrometers of Analytical Instrumentation

The cathode in the Coolidge tube is kept in an inclined manner.(a) True(b) FalseI had been asked this question during an interview.This question is from Instrumentation of X-Ray Spectroscopy in division X-Ray Spectrometers of Analytical Instrumentation

The analysis of X-ray beam by diffraction is similar to spectrum analysis carried out with a diffraction grating.(a) True(b) FalseThis question was posed to me in quiz.The above asked question is from X-Ray Fluorescent Spectrometer topic in section X-Ray Spectrometers of Analytical Instrumentation

Electron probe microanalyser is a method of destructive elemental analysis.(a) True(b) FalseThe question was posed to me in an interview for job.Enquiry is from Electron Probe Microanalyser in section X-Ray Spectrometers of Analytical Instrumentation

Which of the following is not a target metal used in the Coolidge tube?(a) Rhodium(b) Cobalt(c) Gold(d) SilverThis question was posed to me in quiz.The above asked question is from Instrumentation of X-Ray Spectroscopy in section X-Ray Spectrometers of Analytical Instrumentation

The crystal used as X-ray grating has _______ dimensional lattice arrays.(a) One(b) Two(c) Three(d) FourI have been asked this question in semester exam.Asked question is from X-Ray Fluorescent Spectrometer in portion X-Ray Spectrometers of Analytical Instrumentation

Micro probe analyser cannot be used on inhomogeneous material.(a) True(b) FalseI have been asked this question during an online interview.I need to ask this question from Electron Probe Microanalyser in division X-Ray Spectrometers of Analytical Instrumentation