Which of the following causes the phenomena of sputtering?(a) Primary ion gets embedded in the solid(b) Primary ion is elastically scattered(c) Primary ion is reflected(d) Primary ion is refractedI got this question by my college professor while I was bunking the class.I'd like to ask this question from Ion Spectroscopy in portion Electron and Ion Spectrometers of Analytical Instrumentation

Which of the following causes the phenomena of sputtering?(a) Primary

1.	Which of the following causes the phenomena of sputtering?(a) Primary ion gets embedded in the solid(b) Primary ion is elastically scattered(c) Primary ion is reflected(d) Primary ion is refractedI got this question by my college professor while I was bunking the class.I'd like to ask this question from Ion Spectroscopy in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct choice is (a) Primary ION gets embedded in the solid For explanation I WOULD SAY: Primary ion MAY PENETRATE through a few layers of the surface and get embedded in the solid. This causes scattering.

Discussion

No Comment Found

Related InterviewSolutions

Auger electron spectroscopy can be used for surface chemical analysis in a way similar to which of the following?(a) ESCA(b) SIMS(c) ISS(d) Ion spectroscopyThe question was posed to me in an online quiz.The origin of the question is Auger Electron Spectroscopy topic in division Electron and Ion Spectrometers of Analytical Instrumentation
Which is the most intense line in the X-ray spectrum?(a) Kα1(b) Kα2(c) Kα12(d) Kα22This question was addressed to me in homework.This interesting question is from Instrumentation for Electron Spectroscopy in division Electron and Ion Spectrometers of Analytical Instrumentation
Which of the following is an Auger transition starting from a hole in 1s levels which would be filled up from the 2p level?(a) KLM transition(b) KLL transition(c) LMN transition(d) LLM transitionThis question was posed to me by my college professor while I was bunking the class.Enquiry is from Auger Electron Spectroscopy in chapter Electron and Ion Spectrometers of Analytical Instrumentation
Discrete electrons cannot be observed in electron ionization of an atom due to which of the following reasons?(a) Environmental disturbances(b) Same mass(c) Same charge(d) Electron- electron interactionThe question was posed to me in my homework.The question is from Electron Spectroscopy for Chemical Analysis topic in section Electron and Ion Spectrometers of Analytical Instrumentation
284.6 eV matches which of the following specific atom type?(a) Carbon(b) Oxygen(c) Nitrogen(d) ArgonThe question was posed to me in examination.This key question is from Electron Spectroscopy for Chemical Analysis topic in division Electron and Ion Spectrometers of Analytical Instrumentation
The output of the multiplier is fed to which of the following immediately?(a) Pulse amplifier discriminator(b) DAC(c) ADC(d) Multichannel analyserI had been asked this question during an interview.This key question is from Instrumentation for Electron Spectroscopy topic in chapter Electron and Ion Spectrometers of Analytical Instrumentation
The kinetic energy of the primary ion should be in which of the following range?(a) 0.1-4 keV(b) 0.2-1 keV(c) 0.4-2 keV(d) 0.3-5 keVThis question was posed to me in an online interview.This intriguing question comes from Ion Spectroscopy in section Electron and Ion Spectrometers of Analytical Instrumentation
ESCA gives sufficient chemical information up to a depth about ________ armstrong in oxide.(a) 5-20(b) 15-40(c) 40-100(d) 100-200This question was addressed to me in an internship interview.My question comes from Electron Spectroscopy for Chemical Analysis topic in chapter Electron and Ion Spectrometers of Analytical Instrumentation
Which of the following is also known as X-ray photoelectron spectroscopy?(a) Auger electron spectroscopy(b) Electron impact spectroscopy(c) Electron spectroscopy for chemical analysis(d) Secondary ion mass spectroscopyI have been asked this question in a job interview.The query is from Surface Spectroscopic Techniques in section Electron and Ion Spectrometers of Analytical Instrumentation
The kinetic energy of the ejected photoelectron is dependent upon the energy of which of the following?(a) Ions around(b) Photons around(c) Material(d) Impinging photonThe question was posed to me in a national level competition.This question is from Electron Spectroscopy for Chemical Analysis topic in division Electron and Ion Spectrometers of Analytical Instrumentation

Discussion

No Comment Found

Related InterviewSolutions

Reply to Comment