82 + Interview Questions in Electron And Ion Spectrometers in Analytical Instrumentation Page 1 InterviewSolution

1.	Auger electron spectroscopy can be used for surface chemical analysis in a way similar to which of the following?(a) ESCA(b) SIMS(c) ISS(d) Ion spectroscopyThe question was posed to me in an online quiz.The origin of the question is Auger Electron Spectroscopy topic in division Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Correct answer is (a) ESCA The best I can explain: Auger electron spectroscopy can be USED for SURFACE chemical analysis in a way similar to ESCA. ESCA is ALSO KNOWN as X-ray photoelectron spectroscopy.

Discussion

2.	Which is the most intense line in the X-ray spectrum?(a) Kα1(b) Kα2(c) Kα12(d) Kα22This question was addressed to me in homework.This interesting question is from Instrumentation for Electron Spectroscopy in division Electron and Ion Spectrometers of Analytical Instrumentation
Answer» RIGHT option is (C) Kα12 For explanation: Kα12 is the most intense line in the X-ray SPECTRUM. Different lines have specific energies.

Discussion

3.	Which of the following is an Auger transition starting from a hole in 1s levels which would be filled up from the 2p level?(a) KLM transition(b) KLL transition(c) LMN transition(d) LLM transitionThis question was posed to me by my college professor while I was bunking the class.Enquiry is from Auger Electron Spectroscopy in chapter Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right CHOICE is (b) KLL transition The best I can explain: KLL transition is an AUGER transition starting from a hole in 1s levels which would be filled up from the 2p LEVEL. 2p electron would ALSO be emitted.

Discussion

4.	Discrete electrons cannot be observed in electron ionization of an atom due to which of the following reasons?(a) Environmental disturbances(b) Same mass(c) Same charge(d) Electron- electron interactionThe question was posed to me in my homework.The question is from Electron Spectroscopy for Chemical Analysis topic in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct option is (d) Electron- electron interaction For explanation I would say: Discrete ELECTRONS cannot be observed in electron ionization of an ATOM because of electron-electron interaction. THEREFORE, ESCA cannot be observed when using electron ionization.

Discussion

5.	284.6 eV matches which of the following specific atom type?(a) Carbon(b) Oxygen(c) Nitrogen(d) ArgonThe question was posed to me in examination.This key question is from Electron Spectroscopy for Chemical Analysis topic in division Electron and Ion Spectrometers of Analytical Instrumentation
Answer» RIGHT OPTION is (a) Carbon Explanation: Each ENERGY matches a specific ATOM type. 284.6 EV matches carbon.

Discussion

6.	The output of the multiplier is fed to which of the following immediately?(a) Pulse amplifier discriminator(b) DAC(c) ADC(d) Multichannel analyserI had been asked this question during an interview.This key question is from Instrumentation for Electron Spectroscopy topic in chapter Electron and Ion Spectrometers of Analytical Instrumentation
Answer» RIGHT ANSWER is (a) Pulse amplifier discriminator Easiest EXPLANATION: The output of the multiplier is FED to pulse amplifier discriminator. It is then fed to a multichannel analyser.

Discussion

7.	The kinetic energy of the primary ion should be in which of the following range?(a) 0.1-4 keV(b) 0.2-1 keV(c) 0.4-2 keV(d) 0.3-5 keVThis question was posed to me in an online interview.This intriguing question comes from Ion Spectroscopy in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right choice is (d) 0.3-5 keV To explain: The kinetic energy of the primary ion should be 0.3-5 keV. These primary ions are MADE INCIDENT on the SURFACE.

Discussion

8.	ESCA gives sufficient chemical information up to a depth about ________ armstrong in oxide.(a) 5-20(b) 15-40(c) 40-100(d) 100-200This question was addressed to me in an internship interview.My question comes from Electron Spectroscopy for Chemical Analysis topic in chapter Electron and Ion Spectrometers of Analytical Instrumentation
Answer» RIGHT option is (b) 15-40 The best EXPLANATION: ESCA GIVES sufficient chemical information up to a DEPTH about 15-40 armstrong in oxide. ESCA is also known as X-ray photoelectron spectroscopy.

Discussion

9.	Which of the following is also known as X-ray photoelectron spectroscopy?(a) Auger electron spectroscopy(b) Electron impact spectroscopy(c) Electron spectroscopy for chemical analysis(d) Secondary ion mass spectroscopyI have been asked this question in a job interview.The query is from Surface Spectroscopic Techniques in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Correct answer is (c) ELECTRON SPECTROSCOPY for chemical ANALYSIS To EXPLAIN: Electron spectroscopy for chemical analysis is also known as X-ray photoelectron spectroscopy. It is an EFFECTIVE technique for detecting the elements.

Discussion

10.	The kinetic energy of the ejected photoelectron is dependent upon the energy of which of the following?(a) Ions around(b) Photons around(c) Material(d) Impinging photonThe question was posed to me in a national level competition.This question is from Electron Spectroscopy for Chemical Analysis topic in division Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right choice is (d) Impinging photon Explanation: The kinetic ENERGY of the EJECTED PHOTOELECTRON is DEPENDENT upon the energy of an impinging photon. A FREE electron is ejected.

Discussion

11.	Which of the following is the detection limit of ESCA?(a) 0.1% monolayer(b) 0.5% monolayer(c) 1% monolayer(d) 2% monolayerI got this question in an interview for internship.My question is taken from Electron Spectroscopy for Chemical Analysis topic in chapter Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The CORRECT choice is (a) 0.1% MONOLAYER To elaborate: The DETECTION limit of ESCA is 0.1% monolayer. It has no x-y resolution.

Discussion

12.	The anode is held at __________ positive potential and the filament is held at ____________ potential.(a) High, ground(b) Ground, high(c) Low, high(d) High, lowThis question was posed to me in semester exam.The doubt is from Instrumentation for Electron Spectroscopy topic in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct answer is (a) HIGH, ground Easiest EXPLANATION: The anode is held at high potential and the filament is held at ground potential. ELECTRONS are ACCELERATED from the filament.

Discussion

13.	Synchroton radiation has several advantages over conventional radiation.(a) True(b) FalseThe question was asked in an internship interview.Origin of the question is Instrumentation for Electron Spectroscopy in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right choice is (a) True For explanation I WOULD say: Synchroton radiation has several advantages over CONVENTIONAL radiation. The resolution is very HIGH.

Discussion

14.	Which of the following is one of the most commonly used anode material?(a) Carbon(b) Tungsten(c) Magnesium(d) CesiumI had been asked this question in an online interview.I'm obligated to ask this question of Instrumentation for Electron Spectroscopy in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right CHOICE is (c) MAGNESIUM The EXPLANATION: Magnesium is one of the most commonly USED ANODE material. Aluminium is also commonly used.

Discussion

15.	Magnetic deflection energy analysers are effective than electrostatic types.(a) True(b) FalseThis question was addressed to me in my homework.Enquiry is from Instrumentation for Electron Spectroscopy topic in division Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct CHOICE is (a) True Best EXPLANATION: Magnetic DEFLECTION energy ANALYSERS are EFFECTIVE than electrostatic types. It is less convenient to design and use.

Discussion

16.	In surface spectrometer, which of the following beam is analysed?(a) Reflected beam(b) Absorbed beam(c) Refracted beam(d) Incident beamI got this question in an interview for internship.Query is from Surface Spectroscopic Techniques in division Electron and Ion Spectrometers of Analytical Instrumentation
Answer» RIGHT choice is (a) Reflected beam For EXPLANATION I WOULD say: When a beam is FOCUSSED on a surface, ONE beam enters the material and a second beam is reflected. The reflected beam is analysed.

Discussion

17.	Surface analysis cannot provide any chemical information directly.(a) True(b) FalseThis question was posed to me in an interview for internship.My doubt stems from Surface Spectroscopic Techniques topic in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» RIGHT answer is (B) False Explanation: Surface ANALYSIS can PROVIDE chemical information. Electron and ION spectroscopic techniques are types of surface analysis.

Discussion

18.	By studying which of the following can we determine if the surface corresponds to C-O or C=O chemical form?(a) Mass of the electron(b) Energy of the carbon peak(c) Binding energy(d) Charge of electronI had been asked this question during an online interview.My enquiry is from Electron Spectroscopy for Chemical Analysis topic in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct option is (b) ENERGY of the CARBON PEAK For explanation: By studying energy of the carbon peak it can be DETERMINED if the surface corresponds to C-O or C=O CHEMICAL form. Thus, the specimen chemical composition can be obtained.

Discussion

19.	The kinetic energy of the photoelectron energies is dependent on _________ of the atom, which makes XPS useful to identify the oxide state.(a) Mass(b) Charge(c) Chemical environment(d) VolumeThis question was posed to me in an internship interview.My question is taken from Electron Spectroscopy for Chemical Analysis topic in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Correct option is (c) Chemical environment To elaborate: The kinetic energy of the photoelectron energies is dependent on the chemical environment of the atom, which makes XPS USEFUL to IDENTIFY the oxide STATE. It also helps to identify the LIGANDS of the atom.

Discussion

20.	The characterisation of auger spectroscopy can be achieved up to which of the following depths?(a) 1 nm(b) 2 nm(c) 4 nm(d) 8 nmI got this question in an online quiz.This interesting question is from Auger Electron Spectroscopy in chapter Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Correct option is (a) 1 nm The BEST I can explain: The characterisation of auger spectroscopy can be achieved up to a depth of 1nm. Best INSTRUMENTS can characterise few nm.

Discussion

21.	Electron ionization can produce which of the following?(a) ESCA electron(b) Auger electron(c) Ion(d) PhotonThis question was addressed to me during an internship interview.This question is from Auger Electron Spectroscopy topic in chapter Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right answer is (b) Auger electron To EXPLAIN I WOULD say: Electron ionization can PRODUCE Auger electron. Photo-ionisation can ALSO produce Auger electron.

Discussion

22.	Which of the following denotes the sample destruction that occurs in Auger electron spectroscopy?(a) None in 95% of sample(b) None in 99% of sample(c) None in 100% of sample(d) FrequentI have been asked this question by my school teacher while I was bunking the class.My question comes from Auger Electron Spectroscopy in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right answer is (d) Frequent For explanation: Frequent sample destruction occurs in Auger ELECTRON SPECTROSCOPY. It is bad for ORGANICS.

Discussion

23.	Which of the following causes the phenomena of sputtering?(a) Primary ion gets embedded in the solid(b) Primary ion is elastically scattered(c) Primary ion is reflected(d) Primary ion is refractedI got this question by my college professor while I was bunking the class.I'd like to ask this question from Ion Spectroscopy in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct choice is (a) Primary ION gets embedded in the solid For explanation I WOULD SAY: Primary ion MAY PENETRATE through a few layers of the surface and get embedded in the solid. This causes scattering.

Discussion

24.	Which of the following is the x-y resolution of SIMS?(a) 1 µ(b) 10 µ(c) 100 µ(d) 1000 µThe question was asked in an interview.The doubt is from Ion Spectroscopy in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Correct answer is (a) 1 µ For EXPLANATION I would SAY: The x-y resolution of SIMS is 1 µ. It has this resolution when USED with ION microprobe.

Discussion

25.	Which of the following is the amount of matrix effect that occurs in SIMS?(a) Very low(b) Low(c) Some(d) SevereI got this question in an internship interview.I'd like to ask this question from Ion Spectroscopy topic in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right answer is (d) SEVERE The EXPLANATION is: Severe MATRIX effects occur in SIMS. Some matrix effects occur in ISS.

Discussion

26.	ISS is less sensitive than which of the following?(a) SIMS(b) Auger(c) ESCA(d) AESThis question was posed to me during an interview.Query is from Instrumentation of Ion Spectroscopy topic in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» RIGHT CHOICE is (a) SIMS To explain: ISS is less sensitive than SIMS. It is more sensitive than Auger or ESCA.

Discussion

27.	In ion spectroscopy, the positive ions are focussed on the sample at which of the following angles?(a) 20^o(b) 30^o(c) 45^o(d) 90^oThe question was posed to me in a national level competition.My doubt is from Instrumentation of Ion Spectroscopy topic in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct choice is (c) 45^o To EXPLAIN: In ion SPECTROSCOPY, the positive ions are FOCUSSED on the SAMPLE at 45^o. Ions are formed by bombardment.

Discussion

28.	After passing through the pre-filter, ions are passed through which of the following?(a) Quadrupole mass spectrometer(b) Time of flight mass spectrometer(c) Radiofrequency mass spectrometer(d) Magnetic deflection mass spectrometerI have been asked this question in an interview.I would like to ask this question from Instrumentation of Ion Spectroscopy in chapter Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right ANSWER is (a) Quadrupole MASS SPECTROMETER Easy explanation: After passing through the pre-filter, ions are passed through quadrupole mass spectrometer. Pre-filter is a DISCRIMINATOR.

Discussion

29.	Which of the following can be used as the detector in ion spectroscopy?(a) Faraday cup collector(b) Channel electron multiplier(c) Micro-channel plate(d) Flame ionization detectorThe question was posed to me during a job interview.I'm obligated to ask this question of Instrumentation of Ion Spectroscopy topic in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right answer is (B) Channel electron multiplier The best explanation: Channel electron multiplier can be used as the DETECTOR in ion SPECTROSCOPY. SOLID state detector can also be used.

Discussion

30.	Which of the following is the energy after collision with a surface atom for a scattering angle of 90^o when Eo is the energy of the incident ion, M1 is the mass of the incident ion and M2 is the mass of the target surface?(a) Eo(M2-M1)/(M2+M1)(b) Eo(M2+M1)/(M2-M1)(c) Eo(M2×M1)/(M2+M1)(d) Eo(M2-M1)/(M2×M1)I got this question by my school principal while I was bunking the class.Asked question is from Instrumentation of Ion Spectroscopy topic in division Electron and Ion Spectrometers of Analytical Instrumentation
Answer» CORRECT option is (a) EO(M2-M1)/(M2+M1) The best I can explain: Eo(M2-M1)/(M2+M1) is the ENERGY after collision with a SURFACE atom for a scattering angle of 90^o. But, this is valid only when M1

Discussion

31.	Both ISS and SIMS have depth profiling capability.(a) True(b) FalseI got this question in an interview for internship.The origin of the question is Ion Spectroscopy in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right choice is (a) True The best I can EXPLAIN: Both ISS and SIMS have depth PROFILING CAPABILITY. ISS is SLOW in depth profiling but SIMS is RAPID.

Discussion

32.	Which of the following is the detection limit of ISS for monolayer?(a) 10 ^-1 %(b) 10 ^-2 %(c) 10 ^-3 %(d) 10 ^-4 %I had been asked this question during an online interview.I'm obligated to ask this question of Instrumentation of Ion Spectroscopy in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct choice is (c) 10 ^-3 % To explain I would say: 10^-3% of the monolayer is the detection limit of ISS. It can be effectively USED for DEPTH PROFILING.

Discussion

33.	The specificity will vary depending on the scattering gas used.(a) True(b) FalseI got this question in quiz.This intriguing question originated from Instrumentation of Ion Spectroscopy in chapter Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The CORRECT answer is (a) True Explanation: The SPECIFICITY will vary depending on the scattering GAS used. Only a few gases are PREFERRED to avoid side EFFECTS.

Discussion

34.	Which of the following is the lightest isotope used as a primary ion?(a) He(b) ^2He(c) ^3He(d) ^3HThe question was posed to me in semester exam.My enquiry is from Instrumentation of Ion Spectroscopy topic in chapter Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The CORRECT OPTION is (c) ^3He Best explanation: ^3He is the LIGHTEST isotope used as a primary ion. THOUGH hydrogen is lightest it is not used.

Discussion

35.	In order to obtain ISS spectra, the backscattered primary ions are sampled by which of the following?(a) Faraday cup analyser(b) Photographic analyser(c) Micro-channel analyser(d) Cylindrical mirror analyserThis question was posed to me in a job interview.My doubt stems from Instrumentation of Ion Spectroscopy topic in chapter Electron and Ion Spectrometers of Analytical Instrumentation
Answer» RIGHT option is (d) Cylindrical mirror analyser Easiest explanation: In order to obtain ISS spectra, the backscattered primary ions are SAMPLED by cylindrical mirror analyser. Their KINETIC energies are then MEASURED.

Discussion

36.	Which of the following is the energy range of ISS?(a) 1 keV(b) 2 keV(c) 4 keV(d) 8 keVI got this question in class test.I would like to ask this question from Ion Spectroscopy topic in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct ANSWER is (a) 1 keV To explain I would say: The energy range of the ISS is 1 keV. ISS STANDS for ion SCATTERING spectroscopy.

Discussion

37.	Which of the following gases is not often used in ion spectroscopy?(a) Helium(b) Argon(c) Nitrogen(d) NeonThis question was posed to me in an online interview.I'd like to ask this question from Instrumentation of Ion Spectroscopy topic in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» RIGHT ANSWER is (c) Nitrogen Best explanation: Helium, argon and inert gases are usually CHOSEN for ion spectroscopy. These gases are chosen to AVOID side effects.

Discussion

38.	ISS is sensitive to every element heavier than which of the following?(a) Helium(b) Hydrogen(c) Nitrogen(d) NeonI have been asked this question by my college director while I was bunking the class.My question comes from Instrumentation of Ion Spectroscopy in chapter Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct answer is (a) Helium The EXPLANATION: ISS is SENSITIVE to EVERY element heavier than helium. The LIGHTEST isotope used as a primary ion is that of helium.

Discussion

39.	Which of the following is denotes the absolute quantitative analysis of SIMS?(a) 30%(b) 70%(c) 50%(d) Not possibleI have been asked this question in an international level competition.This intriguing question originated from Ion Spectroscopy in division Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right option is (d) Not possible The BEST EXPLANATION: Absolute quantitative analysis is not possible in SIMS. It is possible in ISS.

Discussion

40.	Which of the following is the range of quadrupole mass spectrometer used in SIMS?(a) 100-200 amu(b) 200-300 amu(c) 500-1000 amu(d) 200-500 amuI had been asked this question in an internship interview.My enquiry is from Instrumentation of Ion Spectroscopy topic in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» RIGHT choice is (c) 500-1000 amu The BEST explanation: 500-1000 amu is the range of quadrupole mass SPECTROMETER used in SIMS. SIMS shows GOOD specificity.

Discussion

41.	Which of the following is the x-y resolution of ISS?(a) 1 µ(b) 10 µ(c) 100 µ(d) 1000 µI had been asked this question during an interview.The above asked question is from Ion Spectroscopy in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct OPTION is (c) 100 µ The EXPLANATION: The x-y resolution of ISS is 100 µ. It has a POOR x-y resolution.

Discussion

42.	Which of the following is the resolution of quadrupole mass spectrometer used in SIMS?(a) 1 amu(b) 2 amu(c) 5 amu(d) 3 amuThis question was addressed to me in class test.The doubt is from Instrumentation of Ion Spectroscopy in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Correct CHOICE is (a) 1 amu Best explanation: 1 amu is the RESOLUTION of quadrupole mass spectrometer used in SIMS. SIMS SHOWS GOOD specificity.

Discussion

43.	It is advantageous to use ions from a variety of gases.(a) True(b) FalseThis question was addressed to me in a job interview.My question is based upon Instrumentation of Ion Spectroscopy in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» CORRECT answer is (a) True To elaborate: It is advantageous to use ions from a variety of GASES. Few gases are CHOSEN to AVOID side EFFECTS.

Discussion

44.	Only those electrons which are in a selected small solid angle are received in the ________ electrostatic analyser.(a) 100^o(b) 127^o(c) 180^o(d) 263^oI got this question by my school teacher while I was bunking the class.I want to ask this question from Instrumentation of Ion Spectroscopy in section Electron and Ion Spectrometers of Analytical Instrumentation
Answer» RIGHT ANSWER is (b) 127^o Explanation: Only those electrons which are in a selected small solid angle are RECEIVED in the 127^o electrostatic ANALYSER. Ions are scattered in all directions.

Discussion

45.	Which of the following is the spectral range of SIMS?(a) 0-10 amu(b) 0-100 amu(c) 0-500 amu(d) 0-1000 amuI have been asked this question during an interview for a job.Asked question is from Ion Spectroscopy topic in division Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The CORRECT choice is (c) 0-500 amu Easiest explanation: The spectral range of SIMS is 0-500 amu. SIMS STANDS for SECONDARY ION mass spectroscopy.

Discussion

46.	Qualitative chemical analysis is very often performed using which of the following?(a) ESCA(b) SIMS(c) AES(d) Ion spectroscopyThis question was addressed to me by my school teacher while I was bunking the class.The query is from Auger Electron Spectroscopy in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Correct ANSWER is (c) AES Easy explanation: QUALITATIVE CHEMICAL analysis is very OFTEN performed using AES. Auger nomenclature follows the old x-ray NOTATION.

Discussion

47.	ESCA focusses on which of the following information?(a) Mass of the electron(b) Charge of the electron(c) Binding energy of the electron(d) Mass of atomsI have been asked this question in exam.My doubt is from Electron Spectroscopy for Chemical Analysis topic in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Correct CHOICE is (C) BINDING ENERGY of the electron To elaborate: ESCA focusses on binding energy of the electrons. It focusses on the binding energy which the electrons had before they left the atom.

Discussion

48.	ESCA gives sufficient chemical information up to a depth about ________ armstrong in metals.(a) 5-20(b) 15-40(c) 40-100(d) 100-200I have been asked this question in homework.The query is from Electron Spectroscopy for Chemical Analysis topic in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» The correct choice is (a) 5-20 To explain I would say: ESCA gives sufficient chemical information up to a depth about 5-20 ARMSTRONG in metals. ESCA is also KNOWN as X-ray photoelectron SPECTROSCOPY.

Discussion

49.	Ion etching techniques provides the depth profiling from the surface.(a) True(b) FalseI got this question in an interview for job.Question is from Electron Spectroscopy for Chemical Analysis topic in chapter Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Correct answer is (a) True Best explanation: Ion etching techniques provides the DEPTH profiling from the SURFACE. Binding ENERGY can ALSO be used.

Discussion

50.	Which of the following is the abbreviation of ESCA?(a) Electron scattering chemical analysis(b) Emission spectroscopy combination analysis(c) Electron spectroscopy for chemical analysis(d) Electron spectrum chemically analysedI have been asked this question by my school principal while I was bunking the class.The question is from Surface Spectroscopic Techniques in portion Electron and Ion Spectrometers of Analytical Instrumentation
Answer» Right choice is (C) Electron spectroscopy for chemical ANALYSIS The best EXPLANATION: The ABBREVIATION of ESCA is Electron spectroscopy for chemical analysis. It is a type of electron spectroscopy.

Discussion

Explore topic-wise InterviewSolutions in .

Which is the most intense line in the X-ray spectrum?(a) Kα1(b) Kα2(c) Kα12(d) Kα22This question was addressed to me in homework.This interesting question is from Instrumentation for Electron Spectroscopy in division Electron and Ion Spectrometers of Analytical Instrumentation

284.6 eV matches which of the following specific atom type?(a) Carbon(b) Oxygen(c) Nitrogen(d) ArgonThe question was posed to me in examination.This key question is from Electron Spectroscopy for Chemical Analysis topic in division Electron and Ion Spectrometers of Analytical Instrumentation

Synchroton radiation has several advantages over conventional radiation.(a) True(b) FalseThe question was asked in an internship interview.Origin of the question is Instrumentation for Electron Spectroscopy in section Electron and Ion Spectrometers of Analytical Instrumentation

Magnetic deflection energy analysers are effective than electrostatic types.(a) True(b) FalseThis question was addressed to me in my homework.Enquiry is from Instrumentation for Electron Spectroscopy topic in division Electron and Ion Spectrometers of Analytical Instrumentation

Surface analysis cannot provide any chemical information directly.(a) True(b) FalseThis question was posed to me in an interview for internship.My doubt stems from Surface Spectroscopic Techniques topic in section Electron and Ion Spectrometers of Analytical Instrumentation

The characterisation of auger spectroscopy can be achieved up to which of the following depths?(a) 1 nm(b) 2 nm(c) 4 nm(d) 8 nmI got this question in an online quiz.This interesting question is from Auger Electron Spectroscopy in chapter Electron and Ion Spectrometers of Analytical Instrumentation

Electron ionization can produce which of the following?(a) ESCA electron(b) Auger electron(c) Ion(d) PhotonThis question was addressed to me during an internship interview.This question is from Auger Electron Spectroscopy topic in chapter Electron and Ion Spectrometers of Analytical Instrumentation

Which of the following is the x-y resolution of SIMS?(a) 1 µ(b) 10 µ(c) 100 µ(d) 1000 µThe question was asked in an interview.The doubt is from Ion Spectroscopy in portion Electron and Ion Spectrometers of Analytical Instrumentation

Which of the following is the amount of matrix effect that occurs in SIMS?(a) Very low(b) Low(c) Some(d) SevereI got this question in an internship interview.I'd like to ask this question from Ion Spectroscopy topic in portion Electron and Ion Spectrometers of Analytical Instrumentation

ISS is less sensitive than which of the following?(a) SIMS(b) Auger(c) ESCA(d) AESThis question was posed to me during an interview.Query is from Instrumentation of Ion Spectroscopy topic in section Electron and Ion Spectrometers of Analytical Instrumentation

Both ISS and SIMS have depth profiling capability.(a) True(b) FalseI got this question in an interview for internship.The origin of the question is Ion Spectroscopy in section Electron and Ion Spectrometers of Analytical Instrumentation

The specificity will vary depending on the scattering gas used.(a) True(b) FalseI got this question in quiz.This intriguing question originated from Instrumentation of Ion Spectroscopy in chapter Electron and Ion Spectrometers of Analytical Instrumentation

Which of the following is the lightest isotope used as a primary ion?(a) He(b) ^2He(c) ^3He(d) ^3HThe question was posed to me in semester exam.My enquiry is from Instrumentation of Ion Spectroscopy topic in chapter Electron and Ion Spectrometers of Analytical Instrumentation

Which of the following is the energy range of ISS?(a) 1 keV(b) 2 keV(c) 4 keV(d) 8 keVI got this question in class test.I would like to ask this question from Ion Spectroscopy topic in section Electron and Ion Spectrometers of Analytical Instrumentation

Which of the following is the x-y resolution of ISS?(a) 1 µ(b) 10 µ(c) 100 µ(d) 1000 µI had been asked this question during an interview.The above asked question is from Ion Spectroscopy in section Electron and Ion Spectrometers of Analytical Instrumentation

Which of the following is the resolution of quadrupole mass spectrometer used in SIMS?(a) 1 amu(b) 2 amu(c) 5 amu(d) 3 amuThis question was addressed to me in class test.The doubt is from Instrumentation of Ion Spectroscopy in portion Electron and Ion Spectrometers of Analytical Instrumentation

It is advantageous to use ions from a variety of gases.(a) True(b) FalseThis question was addressed to me in a job interview.My question is based upon Instrumentation of Ion Spectroscopy in portion Electron and Ion Spectrometers of Analytical Instrumentation

Which of the following is the spectral range of SIMS?(a) 0-10 amu(b) 0-100 amu(c) 0-500 amu(d) 0-1000 amuI have been asked this question during an interview for a job.Asked question is from Ion Spectroscopy topic in division Electron and Ion Spectrometers of Analytical Instrumentation

Ion etching techniques provides the depth profiling from the surface.(a) True(b) FalseI got this question in an interview for job.Question is from Electron Spectroscopy for Chemical Analysis topic in chapter Electron and Ion Spectrometers of Analytical Instrumentation